Sunday, October 11, 2009

My Experience with "Noise" (Part II)

Electro Static Discharge (ESD):

I believe most of us have experienced the static electric shock some point of time and are aware about how static electricity is formed. Hence I'm not going to bore you by going into those theories again. Also we know that the generation of static electric voltage is more effective in a dry climatic condition. For your information, the following table shows different means of static electricity generation and the respective voltage levels (Source: ESD Association).

====================== ==============================
Means Of Generation--------------V (10-25% RH)-----V (65-90% RH)
====================================================
Walking across carpet------------------35,000-----------------1,500

Walking across vinyl tile---------------12,000-------------------250

Poly bag picked up from bentch------20,000----------------1,200

Getting up from chair with
Urethane foam-----------------------------18,000----------------1,500
====================== ==============================
In the manufacturing environment, ICs are only specified to survive 2KV HBM (Human Body Model: standard intended to simulate a person becoming charged and discharging from a bare finger to ground through the circuit under test), although some have been specified as high as 8KV while others - particularly newer parts in very small geometry processes - can be 500V or less.

The standard IEC 61000-4-2 specifies the test methodologies & measurement techniques to test the electronic products (& systems), which simulates the real industrial environment having possible ESD hazards. Electronic products are required to be tested for ESD immunity (IEC 61000-4-2) to insure their continued reliable operation if subjected to ESD after commissioned in the field. The European Union’s EMC Directive 2004/108/EC (replaced 89/336/EEC) mandates ESD immunity testing for virtually all electrical and/or electronic products as a requirement for obtaining the CE Mark before shipping to a member state of the European Union. As per IEC 61000-6-2: 2005, Electromagnetic Compatibility (EMC): Generic Standard, a device shall be tested as per IEC 61000-4-2 to verify that it passes the following test levels (at minimum):

1. Air Discharge: 8KV
2. Direct (Contact) Discharge: 4KV
The standard for ESD, IEC 61000-4-2 specifies the standard strike waveform. It is worth to study the nature of the waveform before designing the necessary protection in the circuit.

The ESD waveform specified in IEC 61000-4-2 has a rise time of 0.7 ns to 1.0 ns, resulting in a noise bandwidth (1/πtr) of approximately 450 MHz. This is an important factor to consider while choosing appropriate circuit components.


Protection against ESD:

There could be several way we could protect our devices from ESD. Where ever applicable, one could use series blocking resistor, ceramic capacitor, opto-isolation, bare guard trace, dual-rail clamping diodes, zener diodes, MOVs, TVS diodes or a combination of some of these techniques. The articles published in the following links could be useful as references:
It is not only about selecting a suitable protection device but also important to pay careful attention to the layout design. It is necessary to follow cautious approach in implementing a proper ground system such that the returning current through the protection circuit doesn't interfere with the rest of the circuit in operation. In case of a TVS, the common practice to refer the protection circuit to chassis ground or, in case of systems with non-conductive enclosures, power ground. Mount the TVS closest (as possible) to the entry point, use short and wide traces and used dedicated ground plane if possible, avoid loops and other best practices of high speed design.

Next, we are going to continue our discussion on "Electrical Transient Burst (EFT)' in part III.

Sunday, September 13, 2009

My Experience with "Noise"

For any electronics engineer involved in board design, working with digital circuits running at medium/high speed (clock frequency > ~10Mhz) or SMPS circuit design, "noise" is a nightmare. For any of the new designs, the first question appears in my mind is obviously whether it will work or not. The second question is whether my board will pass the EMC (Electro Magnetic Compliance) tests or not. The first could be more confidently answered than the second. I have most of my experience in digital and mixed circuit design, but I've also seen people struggling for several months to resolve EMC issues on SMPS boards. So far, I've seen SMPS designers having hard time to pass conducted and radiated emission tests, where as digital designers struggle to pass ESD (Electro Static Discharge), EFT (Electrical Fast Trasient) or RF susceptability tests. When I was a novice designer (That doesn't mean that I'm an expert now), I used to ask myself an "open-ended" question before starting a design: What all measures and design practices shall I follow in order to not get stuck due to EMC issues. As I gained experience over time, I've learned that it is better to ask myself a couple of questions:
  1. What are the EMC tests that my product needs to pass?
  2. Can I have the necessary measures and design practices implemented in order to pass those applicable tests?

If I have answered the above two questions satisfactorily, I have experienced a much better success rate.

The generic electromagneic compliance standard IEC 61000-6-2 specify the EMC tests to be conducted and alse specifies the test levels. This is important for an organization to get its products certified by agencies to obtain CE marking on its products. The generic standard IEC 61000-6-2 again calls various standards mentioned below, which are specific to the different EMC tests to be conducted. The following standards documents the detailed testing & measurement techniques for difference EMC tests.

  • IEC 61000-4-1: Over view of IEC 61000-4 series
  • IEC 61000-4-2 : Electro Static Discharge (ESD) Test
  • IEC 61000-4-3: Radio Frequesncy (RF) Immunity Test
  • IEC 61000-4-4: Electric Fast Transient (EFT) Immunity Test
  • IEC 61000-4-5 High Voltage Surge Immunity Test
  • IEC 61000-4-6: Immunity to Conducter Radio Frequency (RF)
  • IEC 61000-4-8: Power frequency magnetic field immunity test.
  • IEC 61000-4-10: Damped oscillatory magnetic field immunity test.
  • IEC 61000-4-11: Voltage dips, short interruptions and voltage variations immunity tests.

There are some more. The tests specified in the above international EMC standards are designed for testing the products in a harsh environment simulating the real world EMI situations. Hence if we approach from understanding the tests specified in those standards and then take necessary precausions in our design in order to pass those tests, it is highly likely that our product will also work in real life environment.

Let us now focus on each of those EMC tests standards by standard. Let's start with ESD: IEC 61000-4-2.

(To Be Continued In Part II...)

Saturday, June 6, 2009

Fixing "Task Manager" recovering from virus attack

In recent past, my personal computer at my home suffered a virus attack in between my previous ani-virus software expired and new ani-virus downloaded. After I installed the Avast anti-virus, it detected several infections. More over I observed that I was no longer able to open task manager. Whenever I used to press "Ctrl+Alt+Del", a message used to pop-up saying similar to "Task manager has been disabled by your administrator". I knew that this damage was caused by the virus attack as I myself is the administrator of my own PC. Also I discovered that the "Run" menu has vanished from the "Start" menu. I was helpless for a moment as I was not able to open "IE" at the same time. All my electronics hobby activities stopped because of this for some time. Some how I had another browser installed, which helped me in access the resources shared by our friends in several websites about the fixes. Thanks to all who have put those information! Finally I could manage to fix it as mentioned below. If you also face a similar issue, execute the following steps.
Step1:
Go to "C:\windows\system32" and click on "gpedit.msc". This will open the group policy editor. Next drill down to "User configuration" --> "Administrative templates" --> "Start Menu and Taskbar".Find "Remove run from start menu". This would be displayed as "Not Configured". Right click on it to display the property. First set “Disable” (followed by clicking on "apply" --> "OK") and next set it back to "Not configured" (followed by clicking on "Apply" --> "OK").
Now you should find run in start menu.
Step2:
Go to "Start" --> "Run", type "gpedit.msc" and press "enter". Drill down to "User Configuration" --> "Administrative Template" --> "System" --> "Ctrl+Alt+Del Options". Right click on "Remove Task Manager" and click on "Properties". The "property" should be set to "Not configured". First set the property to "Disable" (followed by clicking on "apply" --> "OK") and next set it back to "Not configured" (followed by clicking on "Apply" --> "OK").
Now you should be able to invoke the task manager!
Hope you won't need the above tips!!

Tuesday, February 24, 2009

FLASH memory basics

FLASH memories are being used widely as non-volatile memory for the purpose of storing large amount of data in a small foot-print. Flash memory was invented by Dr. Fujio Mansuoka while working for Toshiba in 1980. According to Toshiba, the name "flash" was suggested by Dr. Masuoka's colleague, Mr. Shoji Ariizumi, because the erasure process of the memory contents reminded him of a flash of a camera.Flash memory is a form of EEPROM (Electrically Erasable Programmable Read-Only Memory) that allows multiple memory locations to be erased or written in one programming operation. In other terms, it is a form of rewritable memory chip that, unlike a RAM (Random Access Memory) chip, power supply is not required to hold the contents. It is commonly used in memory cards for computers, USB flash drives, MP3 players, digital cameras, mobile phones and many other electronic embedded products. The FLASH memory has certain advantages as compared to the other non-volatile memories such as EEPROM or the hard drives. FLASH memories
  • offer better (faster) read access time as compared to the EEPROM.
  • offer better kinetic shock resistance than the hard disks.
  • when FLASH memory is packaged in a "memory card", it is enormously durable, can withstand harsh environmental conditions
FLASH memories are of two types - "NAND FLASH" and "NOR FLASH". Both types has certain advantages over the other. The following table and the picture depicts a comparison between these two types of FLASH memory.